Nicolici, Nicola.
Power-constrained testing of VLSI circuits [electronic resource] / by Nicola Nicolici and Bashir M. Al-Hashimi. - Boston : Kluwer Academic Publishers, c2003. - xi, 178 p. : ill. - Frontiers in electronic testing ; 22 . - Frontiers in electronic testing ; 22. .
Includes bibliographical references (p. 163-173) and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2013.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Integrated circuits--Very large scale integration--Testing.
Integrated circuits--Very large scale integration--Protection.
Semiconductors--Thermal properties.
Electronic books.
TK7874.75 / .N53 2003eb
621.39/5/0287
Power-constrained testing of VLSI circuits [electronic resource] / by Nicola Nicolici and Bashir M. Al-Hashimi. - Boston : Kluwer Academic Publishers, c2003. - xi, 178 p. : ill. - Frontiers in electronic testing ; 22 . - Frontiers in electronic testing ; 22. .
Includes bibliographical references (p. 163-173) and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2013.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Integrated circuits--Very large scale integration--Testing.
Integrated circuits--Very large scale integration--Protection.
Semiconductors--Thermal properties.
Electronic books.
TK7874.75 / .N53 2003eb
621.39/5/0287