Microelectronic failure analysis desk reference. 2002 supplement / [electronic resource] :
prepared under the direction of the Electronic Device Failure Analysis Society publications committee.
- Materials Park, OH : ASM International, c2002.
- vi, 210 p. : ill.
Includes bibliographical references and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2009.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Electronic apparatus and appliances--Testing--Handbooks, manuals, etc.
Electronics--Materials--Testing--Handbooks, manuals, etc.
Microelectronics--Materials--Defects--Handbooks, manuals, etc.
Microelectronics--Materials--Testing--Handbooks, manuals, etc.
Semiconductors--Defects--Handbooks, manuals, etc.
Electronic books.
TK7871 / .M52 2002eb
Includes bibliographical references and index.
Electronic reproduction.
Palo Alto, Calif. :
ebrary,
2009.
Available via World Wide Web.
Access may be limited to ebrary affiliated libraries.
Electronic apparatus and appliances--Testing--Handbooks, manuals, etc.
Electronics--Materials--Testing--Handbooks, manuals, etc.
Microelectronics--Materials--Defects--Handbooks, manuals, etc.
Microelectronics--Materials--Testing--Handbooks, manuals, etc.
Semiconductors--Defects--Handbooks, manuals, etc.
Electronic books.
TK7871 / .M52 2002eb