Electrothermal analysis of VLSI systems (Record no. 173588)
| 000 -LEADER | |
|---|---|
| fixed length control field | 01453nam a22003374a 4500 |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.39/5 |
| 245 00 - TITLE STATEMENT | |
| Title | Electrothermal analysis of VLSI systems |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | Boston : |
| Name of publisher | Kluwer Academic Publishers, |
| Year of publication | c2000. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xviii, 210 p. : |
| Other physical details | ill. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Integrated circuits |
| Topical Term | Semiconductors |
| Topical Term | Thermal analysis |
| Topical Term | Metal oxide semiconductors |
| Topical Term | Metal oxide semiconductors, Complementary |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Cheng, Yi-Kan, |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | http://site.ebrary.com/lib/rucke/Doc?id=10047049 |
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