Oxide reliability (Record no. 222681)
| 000 -LEADER | |
|---|---|
| fixed length control field | 01315nam a22003134a 4500 |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.39/732 |
| 245 00 - TITLE STATEMENT | |
| Title | Oxide reliability |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | [River Edge, NJ] : |
| Name of publisher | World Scientific, |
| Year of publication | c2002. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | ix, 270 p. : |
| Other physical details | ill. |
| 490 1# - SERIES STATEMENT | |
| Series statement | Selected topics in electronics and systems ; |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Metal oxide semiconductors |
| Topical Term | Silicon oxide |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Dumin, D. J. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | http://site.ebrary.com/lib/rucke/Doc?id=10201190 |
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