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Oxide reliability

Additional authors: Dumin, D. J. | ebrary, Inc.
Series: Selected topics in electronics and systems ; . v. 23 Published by : World Scientific, ([River Edge, NJ] :) Physical details: ix, 270 p. : ill.
Subject(s): Metal oxide semiconductors -- Reliability. | Silicon oxide -- Deterioration. | Electronic books.
Year: 2002
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Includes bibliographical references.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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