Reliability of MEMS
Series: Advanced micro & nanosystems Published by : Wiley-VCH, (Weinheim :) Physical details: xx, 303 p. : ill. Year: 2013-
http://site.ebrary.com/lib/rucke/Doc?id=10682369
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First edition 2007.
Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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