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ESD

by Voldman, Steven H.
Additional authors: ebrary, Inc.
Published by : J. Wiley, (Chichester, West Sussex, U.K. ; | Hoboken, NJ :) Physical details: xxiv, 384 p.
Subject(s): Semiconductors -- Failures. | Integrated circuits -- Protection. | Integrated circuits -- Testing. | Integrated circuits -- Reliability. | Electric discharges. | Electrostatics. | Electronic books.
Year: 2009
Online resources:
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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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