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Wafer-level testing and test during burn-in for integrated circuits

by Bahukudumbi, Sudarshan.

Additional authors: Chakrabarty, Krishnendu. | ebrary, Inc.

Series: Artech House integrated microsystems series Published by : Artech House, (Boston :) Physical details: xv, 198 p. : ill.

Subject(s): Integrated circuits -- Testing. | Integrated circuits -- Wafer-scale integration. | Semiconductors -- Testing. | Electronic books.

Year: 2010

Online resources:

http://site.ebrary.com/lib/rucke/Doc?id=10412729
- An electronic book accessible through the World Wide Web; click to view

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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2011. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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