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Advanced mathematical & computational tools in metrology & testing VIII

Additional authors: Pavese, Franco. | ebrary, Inc.

Series: Series on advances in mathematics for applied sciences ; . v. 78 Published by : World Scientific, (Singapore ; | Hackensack, NJ :) Physical details: xii, 406 p. : ill.

Subject(s): Measurement -- Congresses. | Physical measurements -- Congresses. | Metrology -- Congresses. | Electronic books.

Year: 2009

Online resources:

http://site.ebrary.com/lib/rucke/Doc?id=10361861
- An electronic book accessible through the World Wide Web; click to view

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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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