System-on-chip test architectures
Series: The Morgan Kaufmann series in systems on silicon Published by : Morgan Kaufmann Publishers, (Amsterdam ; | Boston :) Physical details: xxxvi, 856 p. : ill.
Subject(s):
Systems on a chip
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Testing.
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Integrated circuits
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Very large scale integration
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Testing.
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Integrated circuits
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Very large scale integration
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Design.
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Electronic books.
Year: 2008
Online resources:
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http://site.ebrary.com/lib/rucke/Doc?id=10203465
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Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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