Rongo Univesity Library catalog › Details for: Digital holography for MEMS and microsystem metrology

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Digital holography for MEMS and microsystem metrology

Additional authors: Asundi, Anand. | ebrary, Inc.

Series: The Wiley microsystem and nanotechnology series Published by : Wiley, (Chichester, West Sussex, U.K. ; | Hoboken, N.J. :) Physical details: xxii, 205 p. : ill., port.

Subject(s): Microelectromechanical systems -- Measurement. | Microelectronics -- Measurement. | Holographic testing. | Image processing -- Digital techniques. | Electronic books.

Year: 2011

Online resources:

http://site.ebrary.com/lib/rucke/Doc?id=10484809
- An electronic book accessible through the World Wide Web; click to view

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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2011. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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