Rongo Univesity Library catalog › Details for: Characterization of high Tc materials and devices by electron microscopy

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Characterization of high Tc materials and devices by electron microscopy

Additional authors: Browning, Nigel D. | Pennycook, Stephen J. | ebrary, Inc.

Published by : Cambridge University Press, (Cambridge ; | New York :) Physical details: xii, 391 p. : ill.

Subject(s): High temperature superconductors. | Electron microscopy -- Technique. | Electronic books.

Year: 2000

Online resources:

http://site.ebrary.com/lib/rucke/Doc?id=10065742
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Includes bibliographical references.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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