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Power-constrained testing of VLSI circuits

by Nicolici, Nicola.

Additional authors: Al-Hashimi, Bashir. | ebrary, Inc.

Series: Frontiers in electronic testing ; . 22 Published by : Kluwer Academic Publishers, (Boston :) Physical details: xi, 178 p. : ill.

Subject(s): Integrated circuits -- Very large scale integration -- Testing. | Integrated circuits -- Very large scale integration -- Protection. | Semiconductors -- Thermal properties. | Electronic books.

Year: 2003

Online resources:

http://site.ebrary.com/lib/rucke/Doc?id=10066763
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Includes bibliographical references (p. 163-173) and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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