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CTL for test information of digital ICs

by Kapur, Rohit.

Additional authors: ebrary, Inc.

Published by : Kluwer Academic Publishers, (Boston :) Physical details: ix, 173 p. : ill.

Subject(s): Digital integrated circuits -- Testing -- Standards. | Computer hardware description languages. | Electronic books.

Year: 2003

Online resources:

http://site.ebrary.com/lib/rucke/Doc?id=10067206
- An electronic book accessible through the World Wide Web; click to view

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Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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