Rongo Univesity Library catalog › Details for: ISTFA 2008

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ISTFA 2008

Additional authors: ASM International. | Electronic Device Failure Analysis Society. | ebrary, Inc.

Published by : Asm International, (Materials Park, OH :) Physical details: xx, 528 p. : ill.

Subject(s): Electronics -- Materials -- Testing -- Congresses. | Electronic apparatus and appliances -- Testing -- Congresses. | Electronic books.

Year: 2008

Online resources:

http://site.ebrary.com/lib/rucke/Doc?id=10320212
- An electronic book accessible through the World Wide Web; click to view

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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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