Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits
Series: Frontiers in electronic testing ; . 17 Published by : Kluwer Academic, (New York :) Physical details: xviii, 690 p. : ill.
Subject(s):
Integrated circuits
--
Very large scale integration
--
Testing.
|
Digital integrated circuits
--
Testing.
|
Mixed signal circuits
--
Testing.
|
Semiconductor storage devices
--
Testing.
|
Electronic books.
Year: 2002
Online resources:
-
http://site.ebrary.com/lib/rucke/Doc?id=10053265
- An electronic book accessible through the World Wide Web; click to view
No physical items for this record
Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
There are no comments on this title.