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ISTFA '99

Additional authors: ASM International. | Electronic Device Failure Analysis Society. | ebrary, Inc.
Published by : ASM International, (Materials Park, OH :) Physical details: xvii, 486 p. : ill.
Subject(s): Electronics -- Materials -- Testing -- Congresses. | Electronic apparatus and appliances -- Testing -- Congresses. | Electronic books.
Year: 1999
Online resources:
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Sponsored by EDFAS, ISTFA.

Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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