01389nam a2200325Ia 4500001001200000003000800012006001900020007001500039008004100054020001500095040002100110035002100131050002700152100004700179245015300226260005400379300002500433490005600458504005300514533015200567650002000719650002800739650001900767655002900786700002400815700002400839710001700863830005700880856012600937ebr10174085CaPaEBRm        u        cr cn|||||||||051121s2005    njua    sb    001 0 eng d  z9812563954  aCaPaEBRcCaPaEBR  a(OCoLC)19181848214aTK7871.85b.L48 2005eb1 aLevinshte�in, M. E.q(Mikhail Efimovich)10aBreakdown phenomena in semiconductors and semiconductor devicesh[electronic resource] /cMichael Levinshtein, Juha Kostamovaara, Sergey Vainshtein.  aNew Jersey ;aLondon :bWorld Scientific,cc2005.  axiii, 208 p. :bill.1 aSelected topics in electronics and systems ;vv. 36  aIncludes bibliographical references and indexes.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2009.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aSemiconductors. 0aBreakdown (Electricity) 0aHigh voltages. 7aElectronic books.2local1 aKostamovaara, Juha.1 aVainshtein, Sergey.2 aebrary, Inc. 0aSelected topics in electronics and systems ;vv. 36.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10174085zAn electronic book accessible through the World Wide Web; click to view