01453nam a22003374a 4500001001200000003000800012006001900020007001500039008004100054010001700095020002800112040002100140035002000161050002700181082001700208245009700225260005000322300002600372504005100398533015200449650007600601650006100677650003900738650005300777650006800830655002900898700002600927710001700953856012600970999001901096ebr10047049CaPaEBRm        u        cr cn|||||||||000414s2000    maua    sb    001 0 eng    z   00030175   z079237861X (alk. paper)  aCaPaEBRcCaPaEBR  a(OCoLC)5566407914aTK7874.75.bE54 2000eb04a621.39/522100aElectrothermal analysis of VLSI systemsh[electronic resource] /cYi-Kan Cheng ... [et al.].  aBoston :bKluwer Academic Publishers,cc2000.  axviii, 210 p. :bill.  aIncludes bibliographical references and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2013.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aIntegrated circuitsxVery large scale integrationxMathematical models. 0aSemiconductorsxThermal propertiesxMathematical models. 0aThermal analysisxData processing. 0aMetal oxide semiconductorsxMathematical models. 0aMetal oxide semiconductors, ComplementaryxMathematical models. 7aElectronic books.2local1 aCheng, Yi-Kan,d1968-2 aebrary, Inc.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10047049zAn electronic book accessible through the World Wide Web; click to view  c173588d173588