01598nam a2200349Ia 4500001001200000003000800012006001900020007001500039008004100054020001500095020001800110020001800128040002100146035002100167050002300188111009700211245024200308246005600550246001600606260005600622300002500678504005100703533015200754650006400906650004800970655002901018700001901047700002001066710001701086856012601103999001901229ebr10201334CaPaEBRm        u        cr cn|||||||||061107s2006    si a    sb    101 0 eng d  z9812567585  z9789812567581  z9789812773760  aCaPaEBRcCaPaEBR  a(OCoLC)56045071414aTA169b.A84 2006eb2 aAsian International Workshop on Advanced Reliability Modelingn(2nd :d2006 :cPusan, Korea)10aAdvanced reliability modeling IIh[electronic resource] :breliability testing and improvement : proceedings of the 2nd Asian International Workshop (AIWARM 2006), Busan, Korea, 24-26 August 2006 /cedited by Won Young Yun, Tadashi Dohi.30aProceedings of the 2nd Asian International Workshop3 aAIWARM 2006  aSingapore ;aHong Kong :bWorld Scientific,cc2006.  axvii, 795 p. :bill.  aIncludes bibliographical references and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2009.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aReliability (Engineering)xMathematical modelsvCongresses. 0aComputer networksxReliabilityvCongresses. 7aElectronic books.2local1 aDohi, Tadashi.1 aYun, Won Young.2 aebrary, Inc.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10201334zAn electronic book accessible through the World Wide Web; click to view  c222821d222821