@book{48674,
	author = {Nicolici, Nicola. and Al-Hashimi, Bashir. and ebrary, Inc.},
	title = {Power-constrained testing of VLSI circuits},
	publisher = {Kluwer Academic Publishers,},
	year = {c2003.},
	series = {Frontiers in electronic testing ;},
	address = {Boston :},
	url = {http://site.ebrary.com/lib/rucke/Doc?id=10066763}
}
