01478nam a22003494a 4500001001200000003000800012006001900020007001500039008004100054010001700095020002800112040002100140035002000161050002700181082002200208100002200230245011800252260005000370300002300420490004200443504006400485533015200549650006400701650006700765650004000832655002900872700002400901710001700925830004300942856012600985999001701111ebr10066763CaPaEBRm        u        cr cn|||||||||021209s2003    maua    sb    001 0 eng    z  2002043306  z140207235X (alk. paper)  aCaPaEBRcCaPaEBR  a(OCoLC)7073458714aTK7874.75b.N53 2003eb04a621.39/5/02872211 aNicolici, Nicola.10aPower-constrained testing of VLSI circuitsh[electronic resource] /cby Nicola Nicolici and Bashir M. Al-Hashimi.  aBoston :bKluwer Academic Publishers,cc2003.  axi, 178 p. :bill.1 aFrontiers in electronic testing ;v22  aIncludes bibliographical references (p. 163-173) and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2013.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aIntegrated circuitsxVery large scale integrationxTesting. 0aIntegrated circuitsxVery large scale integrationxProtection. 0aSemiconductorsxThermal properties. 7aElectronic books.2local1 aAl-Hashimi, Bashir.2 aebrary, Inc. 0aFrontiers in electronic testing ;v22.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10066763zAn electronic book accessible through the World Wide Web; click to view  c48674d48674