01121nam a22002894a 4500001001200000003000800012006001900020007001500039008004100054010001700095020001500112040002100127035002100148050002700169082002000196100001800216245008600234260004900320300002300369533015200392650005300544650004500597655002900642710001700671856012600688999001700814ebr10067206CaPaEBRm        u        cr cn|||||||||020917s2003    maua    s     000 0 eng    z  2002034094  z1402072937  aCaPaEBRcCaPaEBR  a(OCoLC)61468599914aTK7874.65b.K35 2003eb04a621.3815/482211 aKapur, Rohit.10aCTL for test information of digital ICsh[electronic resource] /cby Rohit Kapur.  aBoston :bKluwer Academic Publishers,c2003.  aix, 173 p. :bill.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2013.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aDigital integrated circuitsxTestingxStandards. 0aComputer hardware description languages. 7aElectronic books.2local2 aebrary, Inc.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10067206zAn electronic book accessible through the World Wide Web; click to view  c49545d49545