TY  - BOOK
AU  - Bushnell,Michael L.
AU  - Agrawal,Vishwani D.
ED  - ebrary, Inc.
TI  - Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits
T2  - Frontiers in electronic testing
AV  - TK7874.75 .B87 2002eb
PY  - 2002///
CY  - New York
PB  - Kluwer Academic
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
KW  - Digital integrated circuits
KW  - Mixed signal circuits
KW  - Semiconductor storage devices
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2009; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/rucke/Doc?id=10053265
ER  -