@book{86581,
	author = {Bahukudumbi, Sudarshan. and Chakrabarty, Krishnendu. and ebrary, Inc.},
	title = {Wafer-level testing and test during burn-in for integrated circuits},
	publisher = {Artech House,},
	year = {2010.},
	series = {Artech House integrated microsystems series},
	address = {Boston :},
	url = {http://site.ebrary.com/lib/rucke/Doc?id=10412729}
}