01575nam a2200313Ia 4500 ebr10374914 CaPaEBR m u cr cn||||||||| 090729s2009 ohua sb 001 0 eng d 1615030085 9781615030088 CaPaEBR CaPaEBR (OCoLC)647897132 TK7871 .I58 2009eb International Symposium for Testing and Failure Analysis (35th : 2009 : San Jose, Calif.) ISTFA 2009 [electronic resource] : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International. Materials Park, Ohio : Asm International, 2009. xvi, 355 p. : ill. Includes bibliographical references and index. Electronic reproduction. Palo Alto, Calif. : ebrary, 2010. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. Electronic apparatus and appliances Testing Congresses. Electronics Materials Testing Congresses. Electronic books. local ASM International. Electronic Device Failure Analysis Society. ebrary, Inc. http://site.ebrary.com/lib/rucke/Doc?id=10374914 An electronic book accessible through the World Wide Web; click to view 99645 99645