TY  - BOOK
ED  - International Symposium for Testing and Failure Analysis
ED  - ASM International.
ED  - Electronic Device Failure Analysis Society.
ED  - ebrary, Inc.
TI  - ISTFA 2009: conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA 
AV  - TK7871 .I58 2009eb
PY  - 2009///
CY  - Materials Park, Ohio
PB  - Asm International
KW  - Electronic apparatus and appliances
KW  - Testing
KW  - Congresses
KW  - Electronics
KW  - Materials
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2010; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://site.ebrary.com/lib/rucke/Doc?id=10374914
ER  -