01575nam a2200313Ia 4500001001200000003000800012006001900020007001500039008004100054020001500095020001800110040002100128035002100149050002400170111009700194245031800291260005400609300002400663504005100687533015200738650006200890650004900952655002901001710002301030710004801053710001701101856012601118999001701244ebr10374914CaPaEBRm        u        cr cn|||||||||090729s2009    ohua    sb    001 0 eng d  z1615030085  z9781615030088  aCaPaEBRcCaPaEBR  a(OCoLC)64789713214aTK7871b.I58 2009eb2 aInternational Symposium for Testing and Failure Analysisn(35th :d2009 :cSan Jose, Calif.)10aISTFA 2009h[electronic resource] :bconference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /csponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.  aMaterials Park, Ohio :bAsm International,c2009.  axvi, 355 p. :bill.  aIncludes bibliographical references and index.  aElectronic reproduction.bPalo Alto, Calif. :cebrary,d2010.nAvailable via World Wide Web.nAccess may be limited to ebrary affiliated libraries. 0aElectronic apparatus and appliancesxTestingvCongresses. 0aElectronicsxMaterialsxTestingvCongresses. 7aElectronic books.2local2 aASM International.2 aElectronic Device Failure Analysis Society.2 aebrary, Inc.40uhttp://site.ebrary.com/lib/rucke/Doc?id=10374914zAn electronic book accessible through the World Wide Web; click to view  c99645d99645