Rongo Univesity Library catalog › Results of search for 'ccl=su:electronics'

Molecular electronics from principles to practice / by Petty, Michael C. Publication: Chichester, England ; | Hoboken, NJ : John Wiley & Sons, 2007 . xxiii, 517 p. : Date: 2007 Availability: No items available:

	281.	No cover image available Multicarrier modulation with low par applications to DSL and wireless / by Tellado, Jose. Publication: New York : Kluwer Academic, 2002 . xx, 152 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	282.	No cover image available Fundamentals of solid state engineering by Razeghi, M. Publication: Boston : Kluwer Academic, 2002 . xxvi, 630 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	283.	No cover image available Electronic crime scene investigation Publication: New York : Nova Science, 2009 . 202 p. : Date: 2009 Availability: No items available: Add to cart (remove)
	284.	No cover image available Quantum communication, computing and measurement 2 Publication: New York : Kluwer Academic, 2002 . xviii, 534 p. : , Proceedings of the Fourth International Conference on Quantum Communication, Measurement,and Computing, held August 22-27, 1998, in Northwestern University, Evanston, Illinois. Date: 2002 Availability: No items available: Add to cart (remove)
	285.	No cover image available Molecular electronics from principles to practice / by Petty, Michael C. Publication: Chichester, England ; \| Hoboken, NJ : John Wiley & Sons, 2007 . xxiii, 517 p. : Date: 2007 Availability: No items available: Add to cart (remove)
	286.	No cover image available FSM-based digital design using Verilog HDL by Minns, Peter D. Publication: Chichester, England ; \| Hoboken, NJ : J. Wiley & Sons, 2008 . xiii, 391 p. : Date: 2008 Availability: No items available: Add to cart (remove)
	287.	No cover image available Selected papers from the PMAPS 2002 - conference on probabalistic methods applied to power systems, Naples 2002 by Carpinelli, Guido. Publication: Bradford, England : Emerald Group, 2004 . 349 p. Date: 2004 Availability: No items available: Add to cart (remove)
	288.	No cover image available Materials research to meet 21st century defense needs interim report / Publication: Washington, D.C. : National Academies Press, 2001 . xxiii, 77 p. Date: 2001 Availability: No items available: Add to cart (remove)
	289.	No cover image available New organic semiconductors for applications in organic electronics by Du, Chunyan. Publication: New York : Nova Science Publishers, Inc., 2010 . 70 p. : Date: 2010 Availability: No items available: Add to cart (remove)
	290.	No cover image available ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / Publication: Materials Park, OH : Asm International, 2008 . xx, 528 p. : Date: 2008 Availability: No items available: Add to cart (remove)
	291.	No cover image available ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. / Publication: Materials Park, OH : ASM International, 2002 . xxiv, 789 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	292.	No cover image available ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA / Publication: Materials Park, OH : ASM International, 2007 . xvi, 356 p. : Date: 2007 Availability: No items available: Add to cart (remove)
	293.	No cover image available ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. Publication: Materials Park, OH : ASM International, 2000 . xvi, 577 p. : , "Sponsored by EDFAS, ISTFA". Date: 2000 Availability: No items available: Add to cart (remove)
	294.	No cover image available Microelectronic failure analysis desk reference : 2001 supplement / Publication: Materials Park, OH : ASM International, 2001 . v, 171 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	295.	No cover image available ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California / Publication: Materials Park, OH : ASM International, 2001 . xix, 485 p. : , Sponsored by EDFAS, ISTFA. Date: 2001 Availability: No items available: Add to cart (remove)
	296.	No cover image available Lead-free solder interconnect reliability Publication: Materials Park, OH : ASM International, 2005 . x, 292 p. : Date: 2005 Availability: No items available: Add to cart (remove)
	297.	No cover image available Digital surveillance laws, security and related issues / Publication: New York : Nova Science Publishers, 2009 . 94 p. Date: 2009 Availability: No items available: Add to cart (remove)
	298.	No cover image available A field guide to household technology by Sobey, Edwin J. C., Publication: Chicago, Ill. : Chicago Review Press, 2007 . 249 p. : , Includes index. Date: 2007 Availability: No items available: Add to cart (remove)
	299.	No cover image available Chemistry in microelectronics Publication: London : ISTE, 2013 . xii, 372 p. : Date: 2013 Availability: No items available: Add to cart (remove)
	300.	No cover image available Materials research to meet 21st century defense needs Publication: Washington, D.C. : National Academies Press, 2003 . xxii, 307 p. : Date: 2003 Availability: No items available: Add to cart (remove)

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