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Breakdown phenomena in semiconductors and semiconductor devices by Levinshte�in, M. E. Publication: New Jersey ; | London : World Scientific, 2005 . xiii, 208 p. : Date: 2005 Availability: No items available:

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Radiation defect engineering by Kozlovski�i, V. V. Publication: New Jersey ; | London : World Scientific, 2005 . viii, 253 p. : , Reprinted from: International journal of high speed electronics and systems, v. 15, no. 1, 2005. Date: 2005 Availability: No items available:

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