Rongo Univesity Library catalog › Results of search for 'ccl=su:Defects.'

Your search returned 47 results.

	41.	No cover image available Microelectronic failure analysis desk reference : 2001 supplement / Publication: Materials Park, OH : ASM International, 2001 . v, 171 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	42.	No cover image available Fault detection theory, methods and systems / Publication: New York : Nova Science Publishers, 2011 . xii, 302 p. : Date: 2011 Availability: No items available: Add to cart (remove)
	43.	No cover image available A practical guide to diagnosing structural movement in buildings by Holland, Malcolm. Publication: Chichester, West Sussex [England] ; \| Ames, Iowa : Wiley-Blackwell, 2012 . xv, 220 p. : Date: 2012 Availability: No items available: Add to cart (remove)
	44.	No cover image available Building surveys and reports by Noy, Edward A. Publication: Chichester, West Sussex, U.K. ; \| Ames, Iowa : Wiley-Blackwell, 2011 . xvi, 409 p. : Date: 2011 Availability: No items available: Add to cart (remove)
	45.	No cover image available Asymptotic models of fields in dilute and densely packed composites by Movchan, A. B. Publication: London : \| River Edge, NJ : Imperial College Press ; \| World Scientific Pub. [distributor], 2002 . xi, 190 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	46.	No cover image available Topology in ordered phases proceedings of the 1st International Symposium on TOP, 2005 : Sapporo, Japan, 7-10 March 2005 / Publication: Singapore ; \| Hackensack, NJ : World Scientific, 2006 . xiv, 374 p. : , "Proceedings of the 1st International Symposium on Topology ... (TOP2005)"--Pref. Date: 2006 Availability: No items available: Add to cart (remove)
	47.	No cover image available Microelectronics failure analysis desk reference / Publication: Materials Park, Ohio : ASM International, 2011 . xi, 660 p. : Date: 2011 Availability: No items available: Add to cart (remove)

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