Rongo Univesity Library catalog › Results of search for 'ccl=su:Electronics and su:Materials.'

Your search returned 78 results.

	61.	No cover image available Materials research to meet 21st century defense needs Publication: Washington, D.C. : National Academies Press, 2003 . xxii, 307 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	62.	No cover image available Materials research to meet 21st century defense needs interim report / Publication: Washington, D.C. : National Academies Press, 2001 . xxiii, 77 p. Date: 2001 Availability: No items available: Add to cart (remove)
	63.	No cover image available ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / Publication: Materials Park, OH : Asm International, 2008 . xx, 528 p. : Date: 2008 Availability: No items available: Add to cart (remove)
	64.	No cover image available ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. / Publication: Materials Park, OH : ASM International, 2002 . xxiv, 789 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	65.	No cover image available ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA / Publication: Materials Park, OH : ASM International, 2007 . xvi, 356 p. : Date: 2007 Availability: No items available: Add to cart (remove)
	66.	No cover image available ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. Publication: Materials Park, OH : ASM International, 2000 . xvi, 577 p. : , "Sponsored by EDFAS, ISTFA". Date: 2000 Availability: No items available: Add to cart (remove)
	67.	No cover image available Microelectronic failure analysis desk reference : 2001 supplement / Publication: Materials Park, OH : ASM International, 2001 . v, 171 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	68.	No cover image available ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California / Publication: Materials Park, OH : ASM International, 2001 . xix, 485 p. : , Sponsored by EDFAS, ISTFA. Date: 2001 Availability: No items available: Add to cart (remove)
	69.	No cover image available Chemistry in microelectronics Publication: London : ISTE, 2013 . xii, 372 p. : Date: 2013 Availability: No items available: Add to cart (remove)
	70.	No cover image available Materials research to meet 21st century defense needs Publication: Washington, D.C. : National Academies Press, 2003 . xxii, 307 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	71.	No cover image available Electric refractory materials Publication: New York : Marcel Dekker, 2000 . viii, 760 p. : Date: 2000 Availability: No items available: Add to cart (remove)
	72.	No cover image available ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA / Publication: Materials Park, Ohio : Asm International, 2009 . xvi, 355 p. : Date: 2009 Availability: No items available: Add to cart (remove)
	73.	No cover image available Electronic materials science by Irene, Eugene A. Publication: Hoboken, N.J. : Wiley-Interscience, 2005 . xiii, 306 p. : Date: 2005 Availability: No items available: Add to cart (remove)
	74.	No cover image available Energy materials Publication: Chichester, West Sussex, U.K. : Wiley, 2011 . viii, 291 p. : Date: 2011 Availability: No items available: Add to cart (remove)
	75.	No cover image available Computational methods for large systems electronic structure approaches for biotechnology and nanotechnology / Publication: Hoboken, N.J. : Wiley, 2011 . xxii, 659 p. : Date: 2011 Availability: No items available: Add to cart (remove)
	76.	No cover image available ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA / Publication: Materials Park, Ohio : ASM International, 2010 . xix, 464 p. : Date: 2010 Availability: No items available: Add to cart (remove)
	77.	No cover image available Microelectronics failure analysis desk reference / Publication: Materials Park, Ohio : ASM International, 2011 . xi, 660 p. : Date: 2011 Availability: No items available: Add to cart (remove)
	78.	No cover image available ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA / Publication: Materials Park, Ohio : ASM International, 2011 . xix, 456 p. : Date: 2011 Availability: No items available: Add to cart (remove)

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