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1.
Atomic force microscopy exploring basic modes and advanced applications / by Haugstad, Greg, Publication: Hoboken, N.J. : John Wiley & Sons, 2012 . xxii, 464 p. : Date: 2012 Availability: No items available:

2.
Atomic force microscopy exploring basic modes and advanced applications / by Haugstad, Greg, Publication: Hoboken, N.J. : John Wiley & Sons, 2012 . xxii, 464 p. : Date: 2012 Availability: No items available:

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