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Results of search for 'au:Electronic Device Failure Analysis Society, and au:sponsor.'
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Electronic apparatus...
Electronics
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ISTFA 2013 :
conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
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. 1 online resource (633 pages) :
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2.
ISTFA 2013 :
conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
Publication:
. 1 online resource (633 pages) :
Availability:
No items available:
Add to cart
(remove)
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