Rongo Univesity Library catalog › Results of search for 'su:Materials and su:Defects.'

Your search returned 13 results.

	1.	No cover image available Microelectronic failure analysis desk reference. 2002 supplement / Publication: Materials Park, OH : ASM International, 2002 . vi, 210 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	2.	No cover image available Microelectronic failure analysis desk reference : 2001 supplement / Publication: Materials Park, OH : ASM International, 2001 . v, 171 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	3.	No cover image available The technology of building defects by Hinks, John Publication: London ; \| New York : E&FN Spon, 1997 . vii, 361 p. : Date: 1997 Availability: No items available: Add to cart (remove)
	4.	No cover image available Asymptotic models of fields in dilute and densely packed composites by Movchan, A. B. Publication: London : \| River Edge, NJ : Imperial College Press ; \| World Scientific Pub. [distributor], 2002 . xi, 190 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	5.	Dislocation reactions and stacking-fault energies / Publication: . 1 online resource (261 pages) : Availability: No items available: Add to cart (remove)
	6.	Defects and diffusion, theory and simulation : an annual retrospective III / Publication: . 1 online resource (145 pages). Availability: No items available: Add to cart (remove)
	7.	No cover image available Microelectronics failure analysis desk reference / Publication: Materials Park, Ohio : ASM International, 2011 . xi, 660 p. : Date: 2011 Availability: No items available: Add to cart (remove)
	8.	No cover image available Microelectronic failure analysis desk reference. 2002 supplement / Publication: Materials Park, OH : ASM International, 2002 . vi, 210 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	9.	No cover image available Microelectronic failure analysis desk reference : 2001 supplement / Publication: Materials Park, OH : ASM International, 2001 . v, 171 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	10.	No cover image available The technology of building defects by Hinks, John Publication: London ; \| New York : E&FN Spon, 1997 . vii, 361 p. : Date: 1997 Availability: No items available: Add to cart (remove)
	11.	No cover image available Microelectronic failure analysis desk reference : 2001 supplement / Publication: Materials Park, OH : ASM International, 2001 . v, 171 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	12.	No cover image available Asymptotic models of fields in dilute and densely packed composites by Movchan, A. B. Publication: London : \| River Edge, NJ : Imperial College Press ; \| World Scientific Pub. [distributor], 2002 . xi, 190 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	13.	No cover image available Microelectronics failure analysis desk reference / Publication: Materials Park, Ohio : ASM International, 2011 . xi, 660 p. : Date: 2011 Availability: No items available: Add to cart (remove)

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