High-k gate dielectrics for CMOS technology
Published by : Wiley-VCH, (Weinheim :) Physical details: xxxi, 558 p. : ill. (some col.) Year: 2012-
http://site.ebrary.com/lib/rucke/Doc?id=10653595
- An electronic book accessible through the World Wide Web; click to view
Includes bibliographical references and index.
pt. 1. Scaling and challenging of Si-based CMOS -- pt. 2. High-k deposition and materials characterization -- pt. 3. Challenge in interface engineering and electrode -- pt. 4. Development in non-Si-based CMOS technology -- pt. 5. High-k Application in novel devices -- pt. 6. Challenge and directions.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
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