Refine your search

Your search returned 751 results.

201.
202.
203.
A designer's guide to built-in self-test by Stroud, Charles E. Publication: Boston : Kluwer Academic Publishers, 2002 . xvi, 319 p. : Date: 2002 Availability: No items available:

204.
The boundary-scan handbook analog and digital / by Parker, Kenneth P. Publication: New York : Kluwer Academic, 2002 . xxvi, 288 p. : Date: 2002 Availability: No items available:

205.
Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits by Bushnell, Michael L. Publication: New York : Kluwer Academic, 2002 . xviii, 690 p. : Date: 2002 Availability: No items available:

206.
207.
208.
209.
210.
Structural life assessment methods by Liu, A. F. Publication: Materials Park, Ohio : ASM International, 1998 . x, 419 p. : Date: 1998 Availability: No items available:

211.
212.
Non-parametric tests for censored data by Bagdonavi�cius, V. Publication: London : | Hoboken, N.J. : ISTE ; | Wiley, 2011 . xviii, 233 p. Date: 2011 Availability: No items available:

213.
Smooth tests of goodness of fit by Rayner, J. C. W. Publication: New York : Oxford University Press, 1989 . xiv, 162 p. : Date: 1989 Availability: No items available:

214.
Internal friction of materials by Pu�sk�ar, Anton. Publication: Cambridge, UK : Cambridge International Science Publishing, 2003 . xiii, 326 p. : Date: 2003 Availability: No items available:

215.
216.
Personality at work the role of individual differences in the workplace / by Furnham, Adrian. Publication: London ; | New York : Routledge, 1992 . xxiii, 423 p. : Date: 1992 Availability: No items available:

217.
218.
219.
Evaluation of enzyme inhibitors in drug discovery a guide for medicinal chemists and pharmacologists / by Copeland, Robert Allen. Publication: Hoboken, N.J. : Wiley, 2013 . xxx, 538 p. : Date: 2013 Availability: No items available:

220.

Powered by Koha