Your search returned 2 results.

1.
Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits by Bushnell, Michael L. Publication: New York : Kluwer Academic, 2002 . xviii, 690 p. : Date: 2002 Availability: No items available:

2.
Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits by Bushnell, Michael L. Publication: New York : Kluwer Academic, 2002 . xviii, 690 p. : Date: 2002 Availability: No items available:

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