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Results of search for 'au:Al-Hashimi, Bashir.'
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Authors
Al-Hashimi, Bashir
Nicolici, Nicola
Series
Frontiers in electro...
Topics
Integrated circuits
Semiconductors
Your search returned 2 results.
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1.
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Power-constrained testing of VLSI circuits
by
Nicolici, Nicola.
Publication:
Boston : Kluwer Academic Publishers, 2003 . xi, 178 p. :
Date:
2003
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2.
No cover image available
Power-constrained testing of VLSI circuits
by
Nicolici, Nicola.
Publication:
Boston : Kluwer Academic Publishers, 2003 . xi, 178 p. :
Date:
2003
Availability:
No items available:
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