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Results of search for 'au:Bahukudumbi, Sudarshan.'
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Bahukudumbi, Sudarsh...
Chakrabarty, Krishne...
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Artech House integra...
Topics
Integrated circuits
Semiconductors
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1.
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Wafer-level testing and test during burn-in for integrated circuits
by
Bahukudumbi, Sudarshan.
Publication:
Boston : Artech House, 2010 . xv, 198 p. :
Date:
2010
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2.
No cover image available
Wafer-level testing and test during burn-in for integrated circuits
by
Bahukudumbi, Sudarshan.
Publication:
Boston : Artech House, 2010 . xv, 198 p. :
Date:
2010
Availability:
No items available:
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(remove)
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