Your search returned 4 results.

1.
Adaptive cooling of integrated circuits using digital microfluidics by Paik, Philip Y. Publication: Norwood, Mass. : Artech House, 2007 . 203 p. : Date: 2007 Availability: No items available:

2.
Wafer-level testing and test during burn-in for integrated circuits by Bahukudumbi, Sudarshan. Publication: Boston : Artech House, 2010 . xv, 198 p. : Date: 2010 Availability: No items available:

3.
Adaptive cooling of integrated circuits using digital microfluidics by Paik, Philip Y. Publication: Norwood, Mass. : Artech House, 2007 . 203 p. : Date: 2007 Availability: No items available:

4.
Wafer-level testing and test during burn-in for integrated circuits by Bahukudumbi, Sudarshan. Publication: Boston : Artech House, 2010 . xv, 198 p. : Date: 2010 Availability: No items available:

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