Rongo Univesity Library catalog › Results of search for 'au:Stroud, Charles E.'

Your search returned 4 results.

	1.	No cover image available A designer's guide to built-in self-test by Stroud, Charles E. Publication: Boston : Kluwer Academic Publishers, 2002 . xvi, 319 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	2.	No cover image available System-on-chip test architectures nanometer design for testability / Publication: Amsterdam ; \| Boston : Morgan Kaufmann Publishers, 2008 . xxxvi, 856 p. : Date: 2008 Availability: No items available: Add to cart (remove)
	3.	No cover image available A designer's guide to built-in self-test by Stroud, Charles E. Publication: Boston : Kluwer Academic Publishers, 2002 . xvi, 319 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	4.	No cover image available System-on-chip test architectures nanometer design for testability / Publication: Amsterdam ; \| Boston : Morgan Kaufmann Publishers, 2008 . xxxvi, 856 p. : Date: 2008 Availability: No items available: Add to cart (remove)