Rongo Univesity Library catalog › Results of search for 'ccl=su:Electronics and su:Materials.'

Your search returned 78 results.

	1.	No cover image available Organic electronics emerging concepts and technologies / Publication: Weinheim an der Bergstrasse, Germany : Wiley-VCH, 2013 . 1 online resource (xviii, 443 p.) : Date: 2013 Availability: No items available: Add to cart (remove)
	2.	ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA / Publication: . 1 online resource (560 pages) : , Includes index. Availability: No items available: Add to cart (remove)
	3.	No cover image available Polymer electronics a flexible technology / Publication: Shrewsbury : Smithers Rapra Technology, Ltd., 2009 . xiv, 142 p. : Date: 2009 Availability: No items available: Add to cart (remove)
	4.	No cover image available Electrical characterization of organic electronic materials and devices by Stallinga, Peter, Publication: Hoboken, NJ : John Wiley & Sons, 2009 . xi, 303 p. : Date: 2009 Availability: No items available: Add to cart (remove)
	5.	No cover image available ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA. Publication: Materials Park, Ohio : ASM International, 2012 . xxi, 620 p. : Date: 2012 Availability: No items available: Add to cart (remove)
	6.	Electronic materials / by Kwok, H. L., Publication: . 1 online resource (483 pages) : Availability: No items available: Add to cart (remove)
	7.	ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA / Publication: . 1 online resource (633 pages) : Availability: No items available: Add to cart (remove)
	8.	No cover image available ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California. Publication: Materials Park, OH : ASM International, 1999 . xvii, 486 p. : , Sponsored by EDFAS, ISTFA. Date: 1999 Availability: No items available: Add to cart (remove)
	9.	No cover image available ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California / Publication: Materials Park, OH : ASM International, 2005 . xviii, 524 p. : Date: 2005 Availability: No items available: Add to cart (remove)
	10.	No cover image available ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California / Publication: Materials Park, OH : ASM International, 1997 . xix, 346 p. : , "Manager of Book Production Grace M. Davidson." Date: 1997 Availability: No items available: Add to cart (remove)
	11.	No cover image available ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas / Publication: Materials Park, OH : ASM International, 1998 . xix, 490 p. : Date: 1998 Availability: No items available: Add to cart (remove)
	12.	No cover image available ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California. Publication: Materials Park, Ohio : ASM International, 1996 . xiv, 417 p. : Date: 1996 Availability: No items available: Add to cart (remove)
	13.	No cover image available ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts / Publication: Materials Park, OH : ASM International, 2004 . [717] p. : Date: 2004 Availability: No items available: Add to cart (remove)
	14.	No cover image available ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. Publication: Materials Park, OH : ASM International, 2006 . xx, 524 p. : Date: 2006 Availability: No items available: Add to cart (remove)
	15.	No cover image available ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California / Publication: Materials Park, Ohio : ASM International, 2003 . 518 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	16.	No cover image available Microelectronic failure analysis desk reference. 2002 supplement / Publication: Materials Park, OH : ASM International, 2002 . vi, 210 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	17.	No cover image available ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / Publication: Materials Park, OH : Asm International, 2008 . xx, 528 p. : Date: 2008 Availability: No items available: Add to cart (remove)
	18.	No cover image available ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. / Publication: Materials Park, OH : ASM International, 2002 . xxiv, 789 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	19.	No cover image available ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA / Publication: Materials Park, OH : ASM International, 2007 . xvi, 356 p. : Date: 2007 Availability: No items available: Add to cart (remove)
	20.	No cover image available ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. Publication: Materials Park, OH : ASM International, 2000 . xvi, 577 p. : , "Sponsored by EDFAS, ISTFA". Date: 2000 Availability: No items available: Add to cart (remove)

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Your search returned 78 results.