Rongo Univesity Library catalog › Results of search for 'ccl=su:Semiconductor storage devices and su:Testing.'

Your search returned 4 results.

	1.	No cover image available High performance memory testing design principles, fault modeling, and self-test / by Adams, R. Dean. Publication: Boston : Kluwer Academic, 2003 . xiii, 246 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	2.	No cover image available Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits by Bushnell, Michael L. Publication: New York : Kluwer Academic, 2002 . xviii, 690 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	3.	No cover image available High performance memory testing design principles, fault modeling, and self-test / by Adams, R. Dean. Publication: Boston : Kluwer Academic, 2003 . xiii, 246 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	4.	No cover image available Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits by Bushnell, Michael L. Publication: New York : Kluwer Academic, 2002 . xviii, 690 p. : Date: 2002 Availability: No items available: Add to cart (remove)