Rongo Univesity Library catalog › Results of search for 'ccl=su:Semiconductors and su:Materials'

Your search returned 31 results.

	1.	No cover image available Nitride semiconductor devices fundamentals and applications / by Morko�c, Hadis. Publication: Weinheim : Wiley-VCH, 2013 . xiv, 460 p. : Date: 2013 Availability: No items available: Add to cart (remove)
	2.	No cover image available The story of semiconductors by Orton, J. W. Publication: Oxford : Oxford University Press, 2004 . xii, 510 p., [10] p. : Date: 2004 Availability: No items available: Add to cart (remove)
	3.	No cover image available Advanced semiconductor heterostructures novel devices, potential device applications and basic properties / Publication: Singapore ; \| River Edge, N.J. : World Scientific, 2003 . ix, 232 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	4.	No cover image available Nitride semiconductor devices fundamentals and applications / by Morko�c, Hadis. Publication: Weinheim : Wiley-VCH, 2013 . xiv, 460 p. : Date: 2013 Availability: No items available: Add to cart (remove)
	5.	No cover image available The story of semiconductors by Orton, J. W. Publication: Oxford : Oxford University Press, 2004 . xii, 510 p., [10] p. : Date: 2004 Availability: No items available: Add to cart (remove)
	6.	No cover image available Advanced semiconductor heterostructures novel devices, potential device applications and basic properties / Publication: Singapore ; \| River Edge, N.J. : World Scientific, 2003 . ix, 232 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	7.	No cover image available Electrical characterization of organic electronic materials and devices by Stallinga, Peter, Publication: Hoboken, NJ : John Wiley & Sons, 2009 . xi, 303 p. : Date: 2009 Availability: No items available: Add to cart (remove)
	8.	No cover image available Microelectronic failure analysis desk reference. 2002 supplement / Publication: Materials Park, OH : ASM International, 2002 . vi, 210 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	9.	No cover image available Microelectronic failure analysis desk reference : 2001 supplement / Publication: Materials Park, OH : ASM International, 2001 . v, 171 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	10.	No cover image available One-dimensional nanostructures principles and applications / Publication: Hoboken, N.J. : Wiley, 2013 . xxi, 554 p., [32] p. of plates : Date: 2013 Availability: No items available: Add to cart (remove)
	11.	No cover image available Materials for high-temperature semiconductor devices Publication: Washington, D.C. : National Academy Press, 1995 . xv, 119 p. : , "NMAB-474." Date: 1995 Availability: No items available: Add to cart (remove)
	12.	No cover image available Semiconductor strain metrology principles and applications / by Wong, Terence K. S. Publication: [Saif Zone, Sharjah, U.A.E] ; \| Oak Park, IL : Bentham Science, 2012 . 136 p. : Date: 2012 Availability: No items available: Add to cart (remove)
	13.	Advances in semiconducting materials / Publication: . 1 online resource (195 pages) : , " ... selected papers presented at the symposium 19 "Advances in Semiconducting Materials" of the XVI International Materials Research Congress (IMRC2007) held in Cancun, Quintana Roo, Mexico from 28th Oct to 1st Nov 2007."--Pref. Availability: No items available: Add to cart (remove)
	14.	HeteroSiC & WASMPE 2011 : selected, peer reviewed papers from the 4th Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMPE 2011), June 27-30, 2011, Tours, France / Publication: . 1 online resource (269 pages) : Availability: No items available: Add to cart (remove)
	15.	No cover image available Technology evolution for silicon nano-electronics selected, peer reviewed papers from the proceedings of the International Symposium on Technology Evolution for Silicon Nano-Electronics 2010, June 3-5, 2010, Tokyo Institute of Technology, Tokyo, Japan / Publication: Stafa-Zurich, Switzerland ; \| Enfield, N.H. : Trans Tech Publications, 2011 . xi, 234 p. : Date: 2011 Availability: No items available: Add to cart (remove)
	16.	No cover image available Recent topics on modeling of semiconductor processes, devices, and circuits by Onur Topaloglu, Rasit. Publication: Hilversum, The Netherlands : Bentham Science Publishers, 2011 . vi, 191 p. : Date: 2011 Availability: No items available: Add to cart (remove)
	17.	No cover image available III-nitride semiconductor materials / Publication: London : Imperial College Press, 2006 . xii, 428 p. : Date: 2006 Availability: No items available: Add to cart (remove)
	18.	No cover image available Microelectronics failure analysis desk reference / Publication: Materials Park, Ohio : ASM International, 2011 . xi, 660 p. : Date: 2011 Availability: No items available: Add to cart (remove)
	19.	No cover image available Functionalization of semiconductor surfaces Publication: Hoboken, N.J. : Wiley, 2012 . xx, 434 p. : Date: 2012 Availability: No items available: Add to cart (remove)
	20.	No cover image available Microelectronic failure analysis desk reference. 2002 supplement / Publication: Materials Park, OH : ASM International, 2002 . vi, 210 p. : Date: 2002 Availability: No items available: Add to cart (remove)

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Your search returned 31 results.