Rongo Univesity Library catalog › Results of search for 'su:Defects.'

Your search returned 47 results.

	1.	No cover image available Crystals, defects and microstructures modeling across scales / by Phillips, Rob, Publication: Cambridge ; \| New York : Cambridge University Press, 2001 . xxvi, 780 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	2.	No cover image available Crystals, defects and microstructures modeling across scales / by Phillips, Rob, Publication: Cambridge ; \| New York : Cambridge University Press, 2001 . xxvi, 780 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	3.	No cover image available Shopping for safety providing consumer automotive safety information / Publication: Washington, D.C. : National Academy Press, 1996 . vi, 160 p. : Date: 1996 Availability: No items available: Add to cart (remove)
	4.	No cover image available Shopping for safety providing consumer automotive safety information / Publication: Washington, D.C. : National Academy Press, 1996 . vi, 160 p. : Date: 1996 Availability: No items available: Add to cart (remove)
	5.	No cover image available Transient-induced latchup in CMOS integrated circuits by Ker, Ming-Dou. Publication: Singapore ; \| Hoboken, NJ : Wiley, 2009 . xiii, 249 p. : Date: 2009 Availability: No items available: Add to cart (remove)
	6.	No cover image available Corrosion understanding the basics / Publication: Materials Park, OH : ASM International, 2000 . x, 563 p. : Date: 2000 Availability: No items available: Add to cart (remove)
	7.	No cover image available Microelectronic failure analysis desk reference. 2002 supplement / Publication: Materials Park, OH : ASM International, 2002 . vi, 210 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	8.	No cover image available Photoionization of polyvalent ions by Moncke, Doris. Publication: New York : Nova Science Publishers, 2010 . viii, 82 p. : Date: 2010 Availability: No items available: Add to cart (remove)
	9.	No cover image available Microelectronic failure analysis desk reference : 2001 supplement / Publication: Materials Park, OH : ASM International, 2001 . v, 171 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	10.	No cover image available Fault detection theory, methods and systems / Publication: New York : Nova Science Publishers, 2011 . xii, 302 p. : Date: 2011 Availability: No items available: Add to cart (remove)
	11.	No cover image available The technology of building defects by Hinks, John Publication: London ; \| New York : E&FN Spon, 1997 . vii, 361 p. : Date: 1997 Availability: No items available: Add to cart (remove)
	12.	No cover image available Transient-induced latchup in CMOS integrated circuits by Ker, Ming-Dou. Publication: Singapore ; \| Hoboken, NJ : Wiley, 2009 . xiii, 249 p. : Date: 2009 Availability: No items available: Add to cart (remove)
	13.	No cover image available Corrosion understanding the basics / Publication: Materials Park, OH : ASM International, 2000 . x, 563 p. : Date: 2000 Availability: No items available: Add to cart (remove)
	14.	No cover image available A practical guide to diagnosing structural movement in buildings by Holland, Malcolm. Publication: Chichester, West Sussex [England] ; \| Ames, Iowa : Wiley-Blackwell, 2012 . xv, 220 p. : Date: 2012 Availability: No items available: Add to cart (remove)
	15.	Interaction between defects and anelastic phenomena in solids : selected, peer reviewed papers from the XIth International conference on imperfections interaction and anelastic phenomena in solids, IIAPS XI, 24 - 28 September 2007, Tula, Russia / Publication: . 1 online resource (246 pages) : Availability: No items available: Add to cart (remove)
	16.	No cover image available Building surveys and reports by Noy, Edward A. Publication: Chichester, West Sussex, U.K. ; \| Ames, Iowa : Wiley-Blackwell, 2011 . xvi, 409 p. : Date: 2011 Availability: No items available: Add to cart (remove)
	17.	No cover image available Asymptotic models of fields in dilute and densely packed composites by Movchan, A. B. Publication: London : \| River Edge, NJ : Imperial College Press ; \| World Scientific Pub. [distributor], 2002 . xi, 190 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	18.	No cover image available Topology in ordered phases proceedings of the 1st International Symposium on TOP, 2005 : Sapporo, Japan, 7-10 March 2005 / Publication: Singapore ; \| Hackensack, NJ : World Scientific, 2006 . xiv, 374 p. : , "Proceedings of the 1st International Symposium on Topology ... (TOP2005)"--Pref. Date: 2006 Availability: No items available: Add to cart (remove)
	19.	Defects and diffusion studied using PAC spectroscopy / Publication: . 1 online resource (185 pages) : , "Special topic volume with invited peer reviewed papers only." Availability: No items available: Add to cart (remove)
	20.	Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / Publication: . 1 online resource (300 pages). Availability: No items available: Add to cart (remove)

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Your search returned 47 results.