Rongo Univesity Library catalog › Results of search for 'su:Semiconductors and su:Defects.'

Your search returned 15 results.

	1.	No cover image available Transient-induced latchup in CMOS integrated circuits by Ker, Ming-Dou. Publication: Singapore ; \| Hoboken, NJ : Wiley, 2009 . xiii, 249 p. : Date: 2009 Availability: No items available: Add to cart (remove)
	2.	No cover image available Microelectronic failure analysis desk reference. 2002 supplement / Publication: Materials Park, OH : ASM International, 2002 . vi, 210 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	3.	No cover image available Microelectronic failure analysis desk reference : 2001 supplement / Publication: Materials Park, OH : ASM International, 2001 . v, 171 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	4.	No cover image available Transient-induced latchup in CMOS integrated circuits by Ker, Ming-Dou. Publication: Singapore ; \| Hoboken, NJ : Wiley, 2009 . xiii, 249 p. : Date: 2009 Availability: No items available: Add to cart (remove)
	5.	Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / Publication: . 1 online resource (300 pages). Availability: No items available: Add to cart (remove)
	6.	Defects and diffusion in semiconductors. XIV. Publication: . 1 online resource (215 pages) : Availability: No items available: Add to cart (remove)
	7.	Defects and diffusion, theory and simulation : an annual retrospective I / Publication: . 1 online resource (268 pages) : Availability: No items available: Add to cart (remove)
	8.	Defects and diffusion in semiconductors. an annual retrospective / XI : Publication: . 1 online resource (154 pages) : Availability: No items available: Add to cart (remove)
	9.	Defects and diffusion in semiconductors XIII / Publication: . 1 online resource (172 pages) : Availability: No items available: Add to cart (remove)
	10.	Defects and diffusion, theory and simulation : an annual retrospective II / Publication: . 1 online resource (190 pages) : Availability: No items available: Add to cart (remove)
	11.	No cover image available Microelectronics failure analysis desk reference / Publication: Materials Park, Ohio : ASM International, 2011 . xi, 660 p. : Date: 2011 Availability: No items available: Add to cart (remove)
	12.	No cover image available Microelectronic failure analysis desk reference. 2002 supplement / Publication: Materials Park, OH : ASM International, 2002 . vi, 210 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	13.	No cover image available Microelectronic failure analysis desk reference : 2001 supplement / Publication: Materials Park, OH : ASM International, 2001 . v, 171 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	14.	No cover image available Microelectronic failure analysis desk reference : 2001 supplement / Publication: Materials Park, OH : ASM International, 2001 . v, 171 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	15.	No cover image available Microelectronics failure analysis desk reference / Publication: Materials Park, Ohio : ASM International, 2011 . xi, 660 p. : Date: 2011 Availability: No items available: Add to cart (remove)

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