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Results of search for 'ccl=au:Electronic Device Failure Analysis Society,'
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Electronic apparatus...
Electronics
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Your search returned 38 results.
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1.
ISTFA 2014 :
conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
Publication:
. 1 online resource (560 pages) : , Includes index.
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2.
ISTFA 2013 :
conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
Publication:
. 1 online resource (633 pages) :
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3.
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ISTFA '99
proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Publication:
Materials Park, OH : ASM International, 1999 . xvii, 486 p. : , Sponsored by EDFAS, ISTFA.
Date:
1999
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4.
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ISTFA 2005
Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
Publication:
Materials Park, OH : ASM International, 2005 . xviii, 524 p. :
Date:
2005
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5.
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ISTFA 2004
proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Publication:
Materials Park, OH : ASM International, 2004 . [717] p. :
Date:
2004
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6.
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ISTFA 2003
proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Publication:
Materials Park, Ohio : ASM International, 2003 . 518 p. :
Date:
2003
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7.
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Microelectronic failure analysis
desk reference.
2002 supplement /
Publication:
Materials Park, OH : ASM International, 2002 . vi, 210 p. :
Date:
2002
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8.
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ISTFA 2008
conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Publication:
Materials Park, OH : Asm International, 2008 . xx, 528 p. :
Date:
2008
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9.
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ISTFA 2002
proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Publication:
Materials Park, OH : ASM International, 2002 . xxiv, 789 p. :
Date:
2002
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10.
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ISTFA 2007
proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Publication:
Materials Park, OH : ASM International, 2007 . xvi, 356 p. :
Date:
2007
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11.
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ISTFA 2000
proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Publication:
Materials Park, OH : ASM International, 2000 . xvi, 577 p. : , "Sponsored by EDFAS, ISTFA".
Date:
2000
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12.
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Microelectronic failure analysis
desk reference : 2001 supplement /
Publication:
Materials Park, OH : ASM International, 2001 . v, 171 p. :
Date:
2001
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13.
No cover image available
ISTFA 2001
proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
Publication:
Materials Park, OH : ASM International, 2001 . xix, 485 p. : , Sponsored by EDFAS, ISTFA.
Date:
2001
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14.
ISTFA 2013 :
conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
Publication:
. 1 online resource (633 pages) :
Availability:
No items available:
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15.
No cover image available
ISTFA '99
proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Publication:
Materials Park, OH : ASM International, 1999 . xvii, 486 p. : , Sponsored by EDFAS, ISTFA.
Date:
1999
Availability:
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16.
No cover image available
ISTFA 2005
Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
Publication:
Materials Park, OH : ASM International, 2005 . xviii, 524 p. :
Date:
2005
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17.
No cover image available
ISTFA 2004
proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Publication:
Materials Park, OH : ASM International, 2004 . [717] p. :
Date:
2004
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18.
No cover image available
ISTFA 2003
proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Publication:
Materials Park, Ohio : ASM International, 2003 . 518 p. :
Date:
2003
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19.
No cover image available
ISTFA 2009
conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
Publication:
Materials Park, Ohio : Asm International, 2009 . xvi, 355 p. :
Date:
2009
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20.
No cover image available
ISTFA 2010
conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
Publication:
Materials Park, Ohio : ASM International, 2010 . xix, 464 p. :
Date:
2010
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