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Results of search for 'ccl=su:Semiconductor storage devices'

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	1.	No cover image available Terrestrial neutron-induced soft errors in advanced memory devices Publication: Hackensack, NJ : World Scientific, 2008 . xxii, 343 p. : Date: 2008 Availability: No items available: Add to cart (remove)
	2.	No cover image available Terrestrial neutron-induced soft errors in advanced memory devices Publication: Hackensack, NJ : World Scientific, 2008 . xxii, 343 p. : Date: 2008 Availability: No items available: Add to cart (remove)
	3.	No cover image available High performance memory testing design principles, fault modeling, and self-test / by Adams, R. Dean. Publication: Boston : Kluwer Academic, 2003 . xiii, 246 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	4.	No cover image available Memory architecture exploration for programmable embedded systems by Grun, Peter. Publication: Boston : Kluwer Academic Publishers, 2003 . xvi, 128 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	5.	No cover image available CMOS memory circuits by Haraszti, Tegze P. Publication: Boston : Kluwer Academic, 2000 . xxii, 551 p. : Date: 2000 Availability: No items available: Add to cart (remove)
	6.	No cover image available Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits by Bushnell, Michael L. Publication: New York : Kluwer Academic, 2002 . xviii, 690 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	7.	No cover image available Emerging memories technologies and trends / by Prince, Betty. Publication: Norwell, Mass. : Kluwer Academic, 2002 . xvi, 279 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	8.	No cover image available High performance memory testing design principles, fault modeling, and self-test / by Adams, R. Dean. Publication: Boston : Kluwer Academic, 2003 . xiii, 246 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	9.	No cover image available Memory architecture exploration for programmable embedded systems by Grun, Peter. Publication: Boston : Kluwer Academic Publishers, 2003 . xvi, 128 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	10.	No cover image available CMOS memory circuits by Haraszti, Tegze P. Publication: Boston : Kluwer Academic, 2000 . xxii, 551 p. : Date: 2000 Availability: No items available: Add to cart (remove)
	11.	No cover image available Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits by Bushnell, Michael L. Publication: New York : Kluwer Academic, 2002 . xviii, 690 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	12.	No cover image available Emerging memories technologies and trends / by Prince, Betty. Publication: Norwell, Mass. : Kluwer Academic, 2002 . xvi, 279 p. : Date: 2002 Availability: No items available: Add to cart (remove)

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