Rongo Univesity Library catalog › Results of search for 'se:Frontiers in electronic testing'

Your search returned 16 results.

	1.	No cover image available Power-constrained testing of VLSI circuits by Nicolici, Nicola. Publication: Boston : Kluwer Academic Publishers, 2003 . xi, 178 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	2.	No cover image available High performance memory testing design principles, fault modeling, and self-test / by Adams, R. Dean. Publication: Boston : Kluwer Academic, 2003 . xiii, 246 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	3.	No cover image available Boundary-scan interconnect diagnosis by Sousa, Jos�e T. de. Publication: Boston : Kluwer Academic Publishers, 2001 . xxi, 168 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	4.	No cover image available Verification by error modeling using testing techniques in hardware verification / by Radecka, Katarzyna. Publication: Boston : Kluwer Academic Publishers, 2003 . xiv, 216 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	5.	No cover image available Fault injection techniques and tools for embedded systems reliability evaluation Publication: Boston : Kluwer Academic Publishers, 2003 . xiv, 241 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	6.	No cover image available Design for at-speed test, diagnosis, and measurement Publication: Boston : Kluwer Academic, 2000 . xvii, 239 p. : Date: 2000 Availability: No items available: Add to cart (remove)
	7.	No cover image available A designer's guide to built-in self-test by Stroud, Charles E. Publication: Boston : Kluwer Academic Publishers, 2002 . xvi, 319 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	8.	No cover image available Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits by Bushnell, Michael L. Publication: New York : Kluwer Academic, 2002 . xviii, 690 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	9.	No cover image available Verification by error modeling using testing techniques in hardware verification / by Radecka, Katarzyna. Publication: Boston : Kluwer Academic Publishers, 2003 . xiv, 216 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	10.	No cover image available Fault injection techniques and tools for embedded systems reliability evaluation Publication: Boston : Kluwer Academic Publishers, 2003 . xiv, 241 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	11.	No cover image available Power-constrained testing of VLSI circuits by Nicolici, Nicola. Publication: Boston : Kluwer Academic Publishers, 2003 . xi, 178 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	12.	No cover image available High performance memory testing design principles, fault modeling, and self-test / by Adams, R. Dean. Publication: Boston : Kluwer Academic, 2003 . xiii, 246 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	13.	No cover image available Boundary-scan interconnect diagnosis by Sousa, Jos�e T. de. Publication: Boston : Kluwer Academic Publishers, 2001 . xxi, 168 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	14.	No cover image available Design for at-speed test, diagnosis, and measurement Publication: Boston : Kluwer Academic, 2000 . xvii, 239 p. : Date: 2000 Availability: No items available: Add to cart (remove)
	15.	No cover image available A designer's guide to built-in self-test by Stroud, Charles E. Publication: Boston : Kluwer Academic Publishers, 2002 . xvi, 319 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	16.	No cover image available Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits by Bushnell, Michael L. Publication: New York : Kluwer Academic, 2002 . xviii, 690 p. : Date: 2002 Availability: No items available: Add to cart (remove)

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